Abstract (may include machine translation)
We review recent numerical simulations of several models of interface growth in d- dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent α=0.63±0.01 (d=1+1) and α=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. We study also the diode-resistor percolation on a Cayley tree. We find that thus suggesting that the critical exponent for βp=∞ and that the upper critical dimension in this problem is d=dc=∞. Other critical exponents on the Cayley tree are: τ=3,ν||=ν⊥=γ=σ=0. The exponents related to roughness are: α=β=0, z=2.
Original language | English |
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Pages (from-to) | 827-839 |
Number of pages | 13 |
Journal | Fractals |
Volume | 1 |
Issue number | 4 |
DOIs | |
State | Published - 1993 |