Surface roughening with quenched disorder in d dimensions

S Buldyrev, S Havlin, János Kertész, A Shehter, H E Stanley

Research output: Contribution to journalArticlepeer-review

Abstract (may include machine translation)

We review recent numerical simulations of several models of interface growth in d- dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent α=0.63±0.01 (d=1+1) and α=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. We study also the diode-resistor percolation on a Cayley tree. We find that thus suggesting that the critical exponent for βp=∞ and that the upper critical dimension in this problem is d=dc=∞. Other critical exponents on the Cayley tree are: τ=3,ν||=ν⊥=γ=σ=0. The exponents related to roughness are: α=β=0, z=2.
Original languageEnglish
Pages (from-to)827-839
Number of pages13
JournalFractals
Volume1
Issue number4
DOIs
StatePublished - 1993

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