## Abstract (may include machine translation)

One plus one dimensional growth of an Eden model with acceleration sites is investigated by simulations, where the acceleration sites which are distributed at random before the process starts become immediately Eden cells if the surface of Eden cluster touches them. The critical concentration of acceleration sites where the growth rate of the average cluster height diverges is found as p_{c} =0.592 ± 0.005 corresponding to the site percolation threshold of the square lattice. The exponent which characterizes this divergence near the percolation threshold have been found as v = 1.33 ± 0.08. An effective roughness exponent a which characterizes the surface morphology is found to belong to the same universality class as the Eden model for p < p_{c}. At the critical concentration, the present system changes to hold a self-similar surface.

Original language | English |
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Pages (from-to) | 1-9 |

Number of pages | 9 |

Journal | Physica A: Statistical Mechanics and its Applications |

Volume | 259 |

Issue number | 1-2 |

DOIs | |

State | Published - 1 Oct 1998 |

Externally published | Yes |